Eye Blink Detection and Extraction in EEG Signals Using EMD asnd ICA Techniques

Authors

  • Amruta S. Nanjannavar (Student),KLS GIT/Electronics and communication, Belgaum, 590008,India
  • Dr. Veena V. Desai (Professor), KLS GIT/Electronics and communication, Belgaum, 590008,India
  • Prof. D A. Torse (Assit. Professor), KLS GIT/Electronics and communication, Belgaum, 590008,India

Keywords:

Ocular artifact, Electroencephalogram(EEG), empirical mode decomposition(EMD), intrinsic functions, cross-correlation, independent component analysis (ICA).

Abstract

 Eye-blink is the major source of artifact in the electroencephalogram (EEG) recorded signals. The extracted
signal is contaminated by one process called Electro Oculo Gram (EOG). Wavelet based technique is used suppress the
contaminated signal and other method is used as data driven technique is called empirical mode decomposition with
cross-correlation. EMD extracts the signals without any reference electrode and decomposes the non-stationary signals
into series of IMF’s (Intrinsic Mode Functions) , the IMF’s are associated with ocular artifact then it is termed as noisy
IMF. Other different techniques also used to suppress the ocular artifact and correction of EOG. ICA, PCA, Regression
methods are used to suppress the artifact. The received signal is must be in single channel.

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Published

2017-06-25

How to Cite

Amruta S. Nanjannavar, Dr. Veena V. Desai, & Prof. D A. Torse. (2017). Eye Blink Detection and Extraction in EEG Signals Using EMD asnd ICA Techniques. International Journal of Advance Research in Engineering, Science & Technology, 4(6), 187–196. Retrieved from https://ijarest.org/index.php/ijarest/article/view/1616

Issue

Vol. 4 No. 6 (2017): Volume: 04, Issue: 06 - June, 2017.

Section

Articles